Artifact Reduction Based on Sinogram Interpolation for the 3D Reconstruction of Nanoparticles Using Electron Tomography
نویسندگان
چکیده
K. Sentosun, Dr. I. Lobato, Dr. E. Bladt, Dr. Y. Zhang, Prof. D. Van Dyck, Prof. S. Bals EMAT-University of Antwerp Groenenborgerlaan 171, B-2020 Antwerp, Belgium E-mail: [email protected] Dr. W. J. Palenstijn, Prof. K. J. Batenburg Centrum Wiskunde and Informatica Scientific Computing Group Science Park 123, NL-1098XG Amsterdam, The Netherlands Prof. K. J. Batenburg Wiskunde en Natuurwetenschappen Mathematical Institute Leiden University Niels Bohrweg 1, 2333 CA Leiden, The Netherlands The ORCID identification number(s) for the author(s) of this article can be found under https://doi.org/10.1002/ppsc.201700287.
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